MIL-HDBK-11991 (NOTICE 1)
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MIL-HDBK-11991 (NOTICE 1), DEPARTMENT OF DEFENSE HANDBOOK DESIGN OF ELECTRICAL, ELECTRONIC, AND ELECTRO-MECHANICAL EQUIPMENT, GUIDED MISSILE AND ASSOCIATED WEAPON SYSTEMS MIL-HDBK-11991, dated 30 January 1996, is hereby canceled without replacement.
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【英文标准名称】:StandardTestInterfaceLanguage(STIL)fordigitaltestvectordata
【原文标准名称】:数字试验矢量数据用标准试验接口语言(STIL)
【标准号】:IEC62525-2007
【标准状态】:现行
【国别】:国际
【发布日期】:2007-11
【实施或试行日期】:
【发布单位】:国际电工委员会(IEC)
【起草单位】:IEC/TC93
【标准类型】:()
【标准水平】:()
【中文主题词】:自动化;电脑辅助工程;电脑软件辅助工程;数据处理;定义;数字的;信息交流;信息技术;接口;自我检查;自我测试;试验类型;试验程序;测试;测试设备;向量(数学)
【英文主题词】:Automation;CAE;CASE;Computeraidedengineering;Computeraidedsoftwareengineering;Datahandling;Dataprocessing;Definition;Definitions;Digital;Informationinterchange;Informationtechnology;Interfaces;Self-checking;Self-testing;Testpattern;Testprocedures;Testing;Testingdevices;Vectors(mathematics)
【摘要】:Thisstandarddefinesatestdescriptionlanguagethat:a)FacilitatesthetransferoflargevolumesofdigitaltestvectordatafromCAEenvironmentstoautomatedtestequipment(ATE)environments;b)Specifiespattern,format,andtiminginformationsufficienttodefinetheapplicationofdigitaltestvectorstoadeviceundertest(DUT);c)Supportsthevolumeoftestvectordatageneratedfromstructuredtestssuchasscan/automatictestpatterngeneration(ATPG),integraltesttechniquessuchasbuilt-inselftest(BIST),andfunctionaltestspecificationsforICdesignsandtheirassemblies,inaformatoptimizedforapplicationinATEenvironments.Insettingthescopeforanystandard,someissuesaredefinedtonotbepertinenttotheinitialproject.Thefollowingisapartiallistofissuesthatweredroppedfromthescopeofthisinitialproject:—Levels:Akeyaspectofadigitaltestprogramistheabilitytoestablishvoltageandcurrentparameters(levels)forsignalsundertest.Levelhandlingisnotexplicitlydefinedinthecurrentstandard,asthisinformationisbothcompact(notpresentingatransportationissue)andcommonlyestablishedindependentlyofdigitaltestdata,requiringdifferentsupportmechanismsoutsidethecurrentscopeofthisstandard.Terminationvaluesmayaffectlevels.—Diagnostic/fault-tracinginformation:ThegoalofthisstandardistooptimallypresentdatathatneedstobemovedontoATE.Whilediagnosticdata,faultidentificationdata,andmacro/designelementcorrespondencedatacanfallintothiscategory(andisoftenfairlylarge),thisstandardisalsofocusedonintegratedcircuitandassembliestest,andmostdebug/failureanalysisoccursseparatelyfromtheATEforthesestructures.Notethatreturnoffailureinformation(foroff-ATEanalysis)isalsonotpartofthestandardascurrentlydefined.—Dataloggingmechanisms,formatting,andcontrolusuallyarenotdefinedaspartofthiscurrentstandard.—Parametrictestsarenotdefinedasanintegralpartofthisstandard,exceptforoptionalpatternlabelsthatidentifypotentiallocationsforparametrictests,suchasIDDQtestsoralternatingcurrent(AC)timingtests.—Programflow:Testsequencingandorderingarenotdefinedaspartofthecurrentstandardexceptasnecessarytodefinecollectionsofdigitalpatternsmeanttoexecuteasaunit.—Binningconstructsarenotpartofthecurrentstandard.—Analogormixed-signaltest:Whilethisisanareaofconcernformanyparticipants,atthispointtransferofanalogtestdatadoesnotcontributetothesametransportationissueseenwithdigitaldata.—Algorithmicpatternconstructs(suchassequencescommonlyusedformemorytest)arenotcurrentlydefinedaspartofthestandard.—Paralleltest/multisitetestconstructsarenotanintegralpartofthecurrentenvironment.—Userinputandusercontrol/optionsarenotpartofthecurrentstandard.—Characterizationtools,suchasshmooplots,arenotdefinedaspartofthecurrentstandard.
【中国标准分类号】:L74
【国际标准分类号】:25_040;19_080
【页数】:146P.;A4
【正文语种】:英语
【原文标准名称】:数字试验矢量数据用标准试验接口语言(STIL)
【标准号】:IEC62525-2007
【标准状态】:现行
【国别】:国际
【发布日期】:2007-11
【实施或试行日期】:
【发布单位】:国际电工委员会(IEC)
【起草单位】:IEC/TC93
【标准类型】:()
【标准水平】:()
【中文主题词】:自动化;电脑辅助工程;电脑软件辅助工程;数据处理;定义;数字的;信息交流;信息技术;接口;自我检查;自我测试;试验类型;试验程序;测试;测试设备;向量(数学)
【英文主题词】:Automation;CAE;CASE;Computeraidedengineering;Computeraidedsoftwareengineering;Datahandling;Dataprocessing;Definition;Definitions;Digital;Informationinterchange;Informationtechnology;Interfaces;Self-checking;Self-testing;Testpattern;Testprocedures;Testing;Testingdevices;Vectors(mathematics)
【摘要】:Thisstandarddefinesatestdescriptionlanguagethat:a)FacilitatesthetransferoflargevolumesofdigitaltestvectordatafromCAEenvironmentstoautomatedtestequipment(ATE)environments;b)Specifiespattern,format,andtiminginformationsufficienttodefinetheapplicationofdigitaltestvectorstoadeviceundertest(DUT);c)Supportsthevolumeoftestvectordatageneratedfromstructuredtestssuchasscan/automatictestpatterngeneration(ATPG),integraltesttechniquessuchasbuilt-inselftest(BIST),andfunctionaltestspecificationsforICdesignsandtheirassemblies,inaformatoptimizedforapplicationinATEenvironments.Insettingthescopeforanystandard,someissuesaredefinedtonotbepertinenttotheinitialproject.Thefollowingisapartiallistofissuesthatweredroppedfromthescopeofthisinitialproject:—Levels:Akeyaspectofadigitaltestprogramistheabilitytoestablishvoltageandcurrentparameters(levels)forsignalsundertest.Levelhandlingisnotexplicitlydefinedinthecurrentstandard,asthisinformationisbothcompact(notpresentingatransportationissue)andcommonlyestablishedindependentlyofdigitaltestdata,requiringdifferentsupportmechanismsoutsidethecurrentscopeofthisstandard.Terminationvaluesmayaffectlevels.—Diagnostic/fault-tracinginformation:ThegoalofthisstandardistooptimallypresentdatathatneedstobemovedontoATE.Whilediagnosticdata,faultidentificationdata,andmacro/designelementcorrespondencedatacanfallintothiscategory(andisoftenfairlylarge),thisstandardisalsofocusedonintegratedcircuitandassembliestest,andmostdebug/failureanalysisoccursseparatelyfromtheATEforthesestructures.Notethatreturnoffailureinformation(foroff-ATEanalysis)isalsonotpartofthestandardascurrentlydefined.—Dataloggingmechanisms,formatting,andcontrolusuallyarenotdefinedaspartofthiscurrentstandard.—Parametrictestsarenotdefinedasanintegralpartofthisstandard,exceptforoptionalpatternlabelsthatidentifypotentiallocationsforparametrictests,suchasIDDQtestsoralternatingcurrent(AC)timingtests.—Programflow:Testsequencingandorderingarenotdefinedaspartofthecurrentstandardexceptasnecessarytodefinecollectionsofdigitalpatternsmeanttoexecuteasaunit.—Binningconstructsarenotpartofthecurrentstandard.—Analogormixed-signaltest:Whilethisisanareaofconcernformanyparticipants,atthispointtransferofanalogtestdatadoesnotcontributetothesametransportationissueseenwithdigitaldata.—Algorithmicpatternconstructs(suchassequencescommonlyusedformemorytest)arenotcurrentlydefinedaspartofthestandard.—Paralleltest/multisitetestconstructsarenotanintegralpartofthecurrentenvironment.—Userinputandusercontrol/optionsarenotpartofthecurrentstandard.—Characterizationtools,suchasshmooplots,arenotdefinedaspartofthecurrentstandard.
【中国标准分类号】:L74
【国际标准分类号】:25_040;19_080
【页数】:146P.;A4
【正文语种】:英语
基本信息
| 标准名称： | 硬面感光板中光致抗蚀剂和电子束抗蚀剂 |
| 英文名称： | Specification for photoresist/E-beam resist for hard surface photoplates |
| 中标分类： | 电子元器件与信息技术 >> 电子设备专用材料、零件、结构件 >> 电子技术专用材料 |
| ICS分类： | 电子学 >> 集成电路、微电子学 |
| 发布部门： | 国家技术监督局 |
| 发布日期： | 1996-09-09 |
| 实施日期： | 1997-05-01 |
| 首发日期： | 1996-09-09 |
| 作废日期： | 1900-01-01 |
| 主管部门： | 国家标准化管理委员会 |
| 归口单位： | 全国半导体材料和设备标准化技术委员会 |
| 起草单位： | 长沙韶光微电子总公司 |
| 出版社： | 中国标准出版社 |
| 出版日期： | 2004-08-27 |
| 页数： | 平装16开， 页数：8， 字数：10千字 |
| 书号： | 155066.1-13733 |
适用范围
本标准规定了硬面感光板中光致抗蚀剂和电子束抗蚀剂涂层的要求、试验方法等内容。本标准适用于硬面感光板中光致抗蚀剂和电子束抗蚀剂的涂层检验。
前言
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引用标准
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所属分类： 电子元器件与信息技术 电子设备专用材料 零件 结构件 电子技术专用材料 电子学 集成电路 微电子学
